Central Connecticut State UniversityCCSU Mathematics

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Selected Publications:

  1. Saha, K.K., and Bilisoly, R. (2008):

    Testing the homogeneity of the means of several groups of count data in the presence of unequal dispersions. Under Revision with

    Computational Statistics and Data Analysis

    . Click here for details simulation results.

  2. Saha, K.K. (2008):

    Semiparametric estimation for the dispersion parameter in the analysis of over or under dispersed count data.

    Journal of Applied Statistics

    , 35, 1383-1397.

  3. Saha, K.K., and King, M.L. (2008):

    An alternative Wald type test for two linear restrictions with applications to non-linear models.

    Journal of Statistical Computation and Simulation

    , 78, 1017-1031.

  4. Saha, K.K (2008):

    Analysis of one-way layout of count data in the presence of over or under dispersion.

    Journal of Statistical Planning and Inference

    , 138, 2067-2081.

  5. Paul, S.R. and Saha, K.K. (2007):

    The generalized linear model and extensions: A review and some biological and environmental applications.

    Environmetrics

    , 18, 421-443.

  6. Saha, K.K., and Paul, S.R (2005):

    Bias-corrected maximum likelihood estimator of the intra-class correlation parameter for binary data.

    Statistics in Medicine

    , 24, 3497-3512.

  7. Saha, K.K., and Paul, S.R (2005):

    Bias corrected maximum likelihood estimator of the negative binomial dispersion parameter.

    Biometrics

    , 61, 179-185.

  8. Saha, K.K., and Paul, S.R (2004):

    Bias-corrected maximum likelihood and double extended quasi-likelihood estimators of the intra-class correlation parameter for binary data. 2004

    Proceedings of the Biometrics Section

    , American Statistical Association.

  9. Paul, S.R, Saha, K.K., and Balasooriya, U. (2003):

    An empirical investigation of different operating characteristics of several estimates of the intraclass correlation in the analysis of binary data,

    Journal of Statistical Computation and Simulation (JSCS)

    , Vol. 73, No. 7, 507-523.

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